Laboratory microscope / atomic force / bench-top / 3D
AA2000 Angstrom Advanced Inc.

Characteristics

  • Applications:

    laboratory

  • Type:

    atomic force

  • Ergonomics:

    bench-top

  • Observation technique:

    3D

Description

High Performance

Atomic-scale of resolution
Large sample size
DSP(Digital Signal Processing) for great performance
Real time operating system embedded
Fast Ethernet connection with computer

Multi-Function

Atomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
Force Analysis: I-V Curve, I-Z Curve, Force Curve
Online real-time 3D image for better observation
Multi-channel signals for more sample details
Trace-Retrace scan, Back-Forward scan
Multi-Analysis: Granularity and Roughness
Data load-out for further analysis

Easy Operation

Fast automatically tip-engaging
Easy change of the tip holder, for simple switching between STM and AFM
Full digital control, auto system status recognition
Software-based sample movement
Nano-Movie function: Continuous data collection, storage and replay
Modularized design for convenient maintenance and future upgrades

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