FT-IR spectrometer
CryoSAS Bruker Optik GmbH

Characteristics

  • Type:

    FT-IR

Description

The Bruker Optics` Cryogenic Silicon Analysis System (CryoSAS) is a dedicated all-in-one system for the low temperature (<15K) impurity analysis of Silicon. CryoSAS is optimized for operation in the industrial environment.

CryoSAS combines Bruker’s high performance FT-IR spectrometers with built-in, closed-cycle cryo-cooling technique that does not require any liquid Helium. All CryoSAS components are state-of-the-art, yet utilize proven technologies to accomplish a difficult analysis in the demanding silicon production environment. CryoSAS can be operated at a high level of automation including accurate reporting of the analysis results.

Contact our sales team today to learn more about the CryoSAS!

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