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Electron microscopy sample preparation system / automatic / slicing / cryogenization
IB-09060CIS Jeol

Characteristics

  • Applications:

    for electron microscopy

  • Operation:

    automatic

  • Preparation type:

    slicing, cryogenization

  • Configuration:

    bench-top

  • Preparation format:

    thin-film

Description

For easy preparation of TEM thin film/SEM cross section samples of heat sensitive materials

Minimizes thermal damage during ion irradiation using liquid nitrogen
Prepares TEM thin film lamella samples and SEM cross section samples*
Long cryo retention time to fully eliminate damage
Specimen exchange with liquid nitrogen injected

*Maximum sample size: 2.8 mm (L) x 1.0 mm (W) x 0.1 mm (T)

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