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Electron microscopy sample preparation system / automatic / cooling / bench-top
IB-19520CCP Jeol

Characteristics

  • Applications:

    for electron microscopy

  • Operation:

    automatic

  • Preparation type:

    cooling

  • Configuration:

    bench-top

Description

Thermal damage can be reduced by cooling the specimen with liquid nitrogen during processing.
Designed to suppress the consumption of liquid nitrogen, allowing long cooling periods.
Rapid cooling of the specimen while immersed in liquid nitrogen. Return to room temperature. Designed to allow parts to be detached.
Incorporates a mechanism to allow the process from polishing to observation to be performed with exposing the sample to the air.

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