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electron microscopy sample preparation system / automatic / bench-top
IB-19510CP Jeol

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Characteristics

  • Applications:

    for electron microscopy

  • Operation:

    automatic

  • Configuration:

    bench-top

Description

New high-speed and fine milling modes achieve even higher throughput of high-quality cross sections.
Intermittent milling mode is standard, simplifying the handling of specimens susceptible to heat damage.
Improvements to facilitate processing of a wide range of materials include:


High-speed processing achieved with a new ion source
Reduced specimen damage with fine milling & intermittent mode
A Quick Start function reduces total process time
A monitor camera is standard, allowing real-time monitoring of the milling process
Charge preventive IN-situ coating function (option)