XRF spectrometer Axios FAST

for quality control

Multi-element chemical composition analysis in seconds Do you need non-destructive analysis of chemical composition in seconds because of time-critical process control or running sample high-throughputs? With up to 28 elements measured simultaneously in concentration ranges from ppm to 100%, the Malvern Panalytical Axios FAST simultaneous WDXRF spectrometer is the ideal solution. Accurate and robust analysis, ease of operation by less-experienced staff and high up-time go hand in hand with a low cost of ownership. Fast results in time-critical applications With analysis results being available in just a few seconds, the Axios FAST elemental analyzer is the ideal tool for time-critical applications and high sample throughput analysis environments. Main application areas include steel and metals alloy production as well as geological or commercial laboratories where hundreds of samples need to be analyzed every day. High sample throughput With fast sample handling and outstanding operational reliability, the Axios FAST simultaneous XRF spectrometer is the first choice for high-speed analytical control. Continuous loading via turret mechanism 168 position VRC sample changer, with flexible tray loading for unattended batch analysis Direct loading Sample barcode reader for fast, error-free sample loading and data entry Enhanced performance Simultaneous measurement of up to 28 elements, with a minimum of 2 second measurement per sample High sensitivity HiPer channels for light-element analysis Analytical flexibility with the option of up to 4 goniometers Range of X-ray anode materials (Rh, Cr, Mo, Au) enables highest performance for specific application