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... challenging orientations. With this unique design, combined with the ease-of-use advantages of our next-generation optical profiler technology, NPFLEX-1000 delivers gage-capable surface texture and roughness measurements with the throughput ...
Bruker Nano Surfaces
... The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3 D surface ...
Bruker Nano Surfaces
... The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2 D/ 3 D ...
Bruker Nano Surfaces
... The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3 D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution ...
Bruker Nano Surfaces
... . Now, Dektak systems are well-established as the gold standard of stylus profilers; when an accurate, trustworthy stylus profiler is needed, Dektak has long been the unquestioned solution. Dektak Pro takes the next step forward in ...
Bruker Nano Surfaces
... software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that enables unlimited measurement sites, 3 D mapping, and highly ...
Bruker Nano Surfaces
Resolution: 530, 460 nm
Length: 600 mm
Width: 550 mm
... metrology Form deviation from 3 D CAD models providing the geometric difference and tolerance measurement Bi-telecentric lenses with very low field distortion providing accurate metrology Form deviation from 3 D ...
Sensofar Metrology
Magnification: 20, 5, 100, 50, 150 unit
Resolution: 630, 530, 460, 575 nm
Length: 610 mm
... Out-of-focus light is thus prevented from entering the imaging system and only the in-focus plane on the sample is captured. 2 D profiles and 3 D surface images can be captured by scanning the aperture ...
Sensofar Metrology
Magnification: 5, 150, 20, 50, 100 unit
Resolution: 630, 530, 460, 575 nm
Length: 635 mm
... The S neox Five Axis 3 D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3 D optical profiler. ...
Sensofar Metrology
Magnification: 3, 10, 50, 100, 150 unit
Resolution: 550 nm
Length: 365 mm
... measured with S lynx Compact 3 D surface profiler Automotive Consumer electronics Energy LCD Materials science Microelectronics Micromanufacturing Micropaleontology Optics Tooling Semiconductors Watch ...
Sensofar Metrology
... speeding up the measurement procedure. Highlights Measure surface finish in a compact setup Non-contact measurement of 3 D topography, roughness and texture 100 mm z measurement range with CST Continuous Scanning ...
Polytec
... microstructure topography. Combine 3 D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3 D ...
Polytec
... telecentric optics and the outstanding speed and performance cut a very impressive figure indeed. Highlights Quick and precise 3 D surface characterization Non-contact measurement principle and traceable measurement ...
Polytec
... Combined measurement of surface roughness and form deviation with the all-in-one optical 3 D surface metrology Combined measurement of surface roughness and form deviation The TopMap Pro.Surf+ conveniently determines ...
Polytec
... Surface characterization with white-light interferometry The TopMap Metro.Lab from Polytec is a high-precision white-light interferometer (coherence scanning interferometer) with a large vertical range and nanometer resolution. This means the Metro.Lab ...
Polytec
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