3D profilometers

The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D ...

The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched ...

... challenging orientations. With this unique design, combined with the ease-of-use advantages of our next-generation optical profiler technology, NPFLEX-1000 delivers gage-capable surface texture and roughness measurements ...

The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D ...

The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds. This major milestone in stylus profiler ...

... software features make the Dektak XTL the most powerful, easiest to use stylus profiler available. The system utilizes Vision64 software that enables unlimited measurement sites, 3D mapping, ...

... speeding up the measurement procedure. Highlights Measure surface finish in a compact setup Non-contact measurement of 3D topography, roughness and texture 100 mm z measurement range with CST Continuous ...

... microstructure topography. Combine 3D data with color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly ...

... telecentric optics and the outstanding speed and performance cut a very impressive figure indeed. Highlights Quick and precise 3D surface characterization Non-contact measurement principle and ...

... production and even right in the production line thanks to a high level of repeatability. Highlights Quick and precise 3D surface characterization, plus roughness measurement All-in-one system ...

Surface characterization with white-light interferometry The TopMap Metro.Lab from Polytec is a high-precision white-light interferometer (coherence scanning interferometer) with a large vertical range and nanometer resolution. This ...

Length: 800 mm
Width: 695 mm
Height: 890 mm

With high speed and flexibility, Pixie QI provide accurate measurements of any surface. Speed Flexibility All surface types Measurement possibilities Speed and flexibility Production speed measurement and analysis for inline ...

Resolution: 530, 460 nm
Length: 600 mm
Width: 550 mm

... metrology Form deviation from 3D CAD models providing the geometric difference and tolerance measurement Bi-telecentric lenses with very low field distortion providing accurate metrology Form ...

Magnification: 20, 5, 100, 50, 150 unit
Resolution: 630, 530, 460, 575 nm
Length: 610 mm

... Out-of-focus light is thus prevented from entering the imaging system and only the in-focus plane on the sample is captured. 2D profiles and 3D surface images can be captured by scanning ...

Magnification: 5, 150, 20, 50, 100 unit
Resolution: 630, 530, 460, 575 nm
Length: 635 mm

The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D ...

Magnification: 3, 10, 50, 100, 150 unit
Resolution: 550 nm
Length: 365 mm

... measured with S lynx Compact 3D surface profiler Automotive Consumer electronics Energy LCD Materials science Microelectronics Micromanufacturing Micropaleontology Optics Tooling Semiconductors Watch ...