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... The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterization, customizable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology. The gage-capable, ...
Bruker Nano Surfaces
... The ContourX-100 Optical Profilometer sets a new benchmark for accurate and repeatable non-contact surface metrology at a best-in-class price point. The small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities ...
Bruker Nano Surfaces
... The ContourX-500 Optical Profilometer is the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, ...
Bruker Nano Surfaces
... . Now, Dektak systems are well-established as the gold standard of stylus profilers; when an accurate, trustworthy stylus profiler is needed, Dektak has long been the unquestioned solution. Dektak Pro takes the next step forward in ...
Bruker Nano Surfaces
Resolution: 530, 460 nm
Length: 600 mm
Width: 550 mm
The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm. It provides all the benefits of a digital microscope integrated into a high resolution measuring instrument. Extremely easy-to-use with one single button ...
Sensofar Metrology
Magnification: 20, 5, 100, 50, 150 unit
Resolution: 630, 530, 460, 575 nm
Length: 610 mm
... The new S neox outperforms existing optical 3D profiling microscopes in terms of performance, functionality, efficiency and design, providing Sensofar with a class-leading areal measurement system. Faster than ever Everything is faster than before ...
Sensofar Metrology
Magnification: 5, 150, 20, 50, 100 unit
Resolution: 630, 530, 460, 575 nm
Length: 635 mm
... The S neox Five Axis 3D Optical profiler combines a high-accuracy rotational module with the advanced inspection and analysis capabilities of the S neox 3D optical profiler. This enables automatic 3D surface measurements at defined positions ...
Sensofar Metrology
TopMap Micro.View is an easy to use and compact optical profiler. Combine exceptional performance and affordability with this powerful metrology solution. With an extended 100 mm Z measurement range and the CST Continuous Scanning Technology, Micro.View ...
Polytec
... sub-nm resolution and evaluate even steep angles with interferometric precision. Micro.View and Micro.View+ are surface profilers based on Coherence Scanning Technology (CSI) offering an excellent vertical resolution regardless the objective ...
Polytec
... Measuring form parameters like flatness, parallelism or step-height for reliable surface quality inspections and pass-fail analysis. Reliable surface quality inspections and pass-fail analysis The TopMap Pro.Surf quickly, reliably and precisely ...
Polytec
... Combined measurement of surface roughness and form deviation with the all-in-one optical 3D surface metrology Combined measurement of surface roughness and form deviation The TopMap Pro.Surf+ conveniently determines surface roughness and form deviation ...
Polytec
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