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SIM microscopes
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Resolution: 2.8, 60, 4, 3.5 nm
... NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface processing ...
... spatio-temporal resolution with a large scan area, flexible experiment design, and out-standing integration with advanced optical microscope systems. The automated setup, alignment, and re-adjustment of system parameters opens new possibilities ...
Magnification: 60, 100, 20, 40 unit
Resolution: 400 nm - 750 nm
... Resolution The DeepSIM relies on a robust multi-spot lattice SIM technique reaching 100 nm XY resolution; a 2-fold increase in spatial resolution compared to Widefield microscopy Sample Thickness The DeepSIM ...
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