Spectroscopic ellipsometer PHE 102

laboratory

Angstrom Advanced sets the standard in Ellipsometry-bringing the best in ellipsometry technology at the most affordable prices.Angstrom Advanced offers full range of ellipsometers for thin film thickness measurements, optical characterization for refractive index and extinction coefficient analysis (n & k). Our ellipsometers can be used for many different applications and are used in some of the most prestigious laboratories such as MIT, NASA, UC Berkeley, Yale University, Duke University, NIST and many more. Quick measurement in the UV/VIS/NIR range of 250 - 1100 nm with diode array detector or motor spectrometer (monochromator) Optional extension of the spectral range into the NIR (700 - 1700 nm) or (700 - 2100 nm) Optional extension of the UV-VIS range (190 - 1100 nm) Rotating polarizer provides accurate measurement of any polarization state Step scan analyzer for high speed and low noise aquisition Variable angle from 10-90° automated angle from 10-90° is also available Fast determination of thickness and refractive index of single or multi-layer samples Broad range Psi and Delta data are measured automatically and fitted through the PHE-102 software PHE-102 software is the most comprehensive program available for data acquisition and analysis. It combines state-of-the-art mathematical fitting algorithms with a large selection of modeling options for fast and accurate data analysis. An advanced spectroscopic ellipsometry software Built in library of material properties, includes several hundreds material models Mixture of new materials using known material properties