EDXRF spectrometer XRF2501

opticalICP-MSAAS

Every second counts for process and quality control. Test results are urgently needed from the moment the sample is received. XRF2501 is equipped with a simple and intuitive interface that allows you to load samples, touch the button, and get high-quality results in seconds. Compared with AAS,AFS,ICP and ICP-MS analysis technology, there is no need for XRF2501 to dissolve and digest samples, or use chemical reagent. The analysis speed of it is rapid without destroying samples. XRF2501 can be used to analyze samples, whether solid or liquid, pressed or powder, large or small. Wide Applicability: Suitable for solid, liquid, powder and particle samples. Easy Operation: There is no need for complicated sample preprocessing. Users only need to put samples into the test area and click Start to complete the analysis. High Efficiency: 1-15min for single sample analysis (which can be adjusted as required). Modular Design: Free combination as needed fits a variety of usage scenarios. Low Cost: No chemical and other consumables are needed, and no helium is consumed in vacuum mode. Best Resolution and CR: Adopt new generation VITUS silicon drift detector from Germany with the best count rate and energy resolution. Make full use of the output of 50W power optical tube, ensuring XRF2501 has high stability and sensitivity. Wide Range: All elements from Na-U are tested at concentrations ranging from PPM to 100%. Safe Operation: The test chamber of the instrument adopts triple protection measures including thick copper, electronic interlock design and software interrupt, absolutely ensuring no X-ray leakage in any test environment.