Flame spectrophotometer ZA4 series

ultravioletZeemanvisible

Hitachi offers high-precision background correction and high-sensitivity measurement by employing the polarized Zeeman correction method alongside the dual detector method. The addition of a new rapid sequential mode* (supports the flame method) makes it possible to perform even higher throughput analysis, allowing for fast, precise, and highly reproducible measurements in a variety of fi elds, including research and quality management. Features Polarized Zeeman Correction Method Background Correction Using Only Hollow Cathode Lamp The polarized Zeeman correction method, which uses a permanent magnet, provides a stabilized baseline, suppresses the effects of coexisting materials that have absorption of adjacent wavelengths, and facilitates highly reliable analysis. Dual Detector Method Increases the Amount of Sampled Light and Reduces Noise The dual detector method, by which the sample light and reference light are sampled by independent detectors, reduces the baseline noise. The two lights are also detected simultaneously, which increases the accuracy of corrections. Wide Background Detection Range All Elements are Covered by the Polarized Zeeman Correction Method Background correction can be performed for elements that have absorption in the ultraviolet range or visible range. The polarized Zeeman correction method is one choice of correction method and has the advantage that it does not need to be selected for each element. It can also correct elements that cannot be corrected by the D2 lamp correction method, such as sodium and potassium.