FT-IR spectrometer / for research
JASCO has in excess of 50 years experience in the field of infrared spectroscopy. With several offerings in the it’s series of advanced FT-IR samplings accessories and instruments. Unique systems for quality technology applications e.g. measuring thickness of film and CVD in-situ monitoring for research into semiconductors. JASCO offers the most complete selection of FT-IR capability for routine and education analysis for superior research systems.