The JEM-3200FS Field Emission Electron Microscope is equipped with a field emission electron gun of 300 kV accelerating voltage and an in-column energy filter which shows high performance. This electron microscope offers solutions for various biological and materials researches.
In-column energy filter (Omega filter)
The in-column energy filter, built into the imaging lens system, makes possible a magnification range comparable to those obtained with conventional electron microscopes, and makes energy filtered images and energy loss spectra easy to acquire. The electron optical system of the energy filter (omega filter) is designed to minimize the distortion of images, and furthermore, residual distortion is finally eliminated in the factory before shipping.
The optional high sensitivity camera system and optional image processing system make possible the construction of an element mapping system and energy loss spectroscopy system.
New control systems
Systemizing basic functions of electron microscopy, such as the electron gun, electron optical system, goniometer, and evacuation system realizes a highly stabilized, high performance control system.
The use of Windows®*1 for the image screens and user interface makes possible the programming of operations and the central control of attachments.
The new systemized goniometer with piezoelectric driving elements shows much improvement in specimen shift at high magnifications*2.
Notices:Windows is a registered trademark of Microsoft Corporation in the United States and other countries.