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Automatic sample preparation system EM-09100IS
for electron microscopyslicingbenchtop

automatic sample preparation system
automatic sample preparation system
automatic sample preparation system
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Characteristics

Operation
automatic
Applications
for electron microscopy
Preparation type
slicing
Configuration
benchtop
Preparation format
thin-film

Description

Features Innovative Specimen Preparation Method for TEM / STEM / SEM / EPMA / AUGER The Ion Slicer can prepare thin-film specimens without solvents or chemicals and requires no prior treatment of the specimen other than rectangular slicing (no disc grinding or dimple grinding). The Ion Slicer prepares thin-film specimens faster and easier than conventional preparation tools. A low-energy, low-angle Ar ion beam irradiates the specimen while a thin shield belt allows low-angle irradiation of the Ar ion beam (from 0° to 6°), drastically reducing ion-beam irradiation damage to the specimen. The result is a high-quality thin film with few sputtering artifacts--even in soft materials. The Ion Slicer can efficiently prepare thin films from specimens having different compositions, even those having porous composites. Highlights include: High quality TEM pre-treatment Fast preparation No complicated pre-treatments Minimal surface damage Specifications EM-09100IS Ion accelerating voltage1 to 8kV Tilt angleUp to 6°(0.1°step) Beam diameter500μm(FWHM) Milling rate5m/min (8 kV, silicon) Gas for beam irradiationArgon Recommended specimen size2.8mm (in length)0.5 mm (in width) 0.1mm (in thickness) Pressure measurementPenning gauge Main evacuation systemTurbo-molecular pump CCD camera Built-in

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