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Automatic sample preparation system IB-09060CIS
for electron microscopyslicingcryogenization

automatic sample preparation system
automatic sample preparation system
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Characteristics

Operation
automatic
Applications
for electron microscopy
Preparation type
slicing, cryogenization
Configuration
benchtop
Preparation format
thin-film

Description

Features For easy preparation of TEM thin film samples of heat sensitive materials Minimizes thermal damage during ion irradiation using liquid nitrogen Long cryo retention time to fully eliminate damage Specimen exchange with liquid nitrogen injected *Maximum sample size: 2.8 mm (L) x 1.0 mm (W) x 0.1 mm (T) Specifications IB-09060CIS Ion accelerating voltage 1 to 8kV Tilt angle Up to 6°(0.1°step) Ion-beam diameter 500 µm or more (full width at half maximum) Milling speed 5 µm/min(accelerating voltage: 8 kV, Si equivalent value) Gas Argon Maximum specimen size 2.8mm(L)×1.0 mm(W)×0.1mm(T) Specimen-holdercooling temperature-120℃ Time for cooling attainment1h Cooling-retention time8h Specimen take-out time30min Pressure measurementPenning gauge Main vacuum pump Turbo-molecular pump CCD Camera Built-in Dimensions and massesBasic unit500mm(W)×600mm(D)×542mm(H)、70kg Rotary pump150mm(W)×427mm(D)×230.5mm(H)、16kg Display326mm(W)×173mm(D)×380mm(H)、3.7kg Installation Requirements IB-09060CIS PowerSingle-phase AC 100 to 120 V±10 %, 50/60 Hz,0.5 to 0.6 kVA Grounding100Ω or less Argon gasPressure: 0.15±0.05 MPa (1.0 to 2.0 kg/cm2)Purity: 99.9999% or more (argon gas, gas cylinder and regulator should beprovided by the customer) Hose joint: JIS B0203, Rc 1/4 Room temperature 20 to 25℃ Humidity 60% or less

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