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Laboratory microscope JEM-ARM300F
for researchtransmission electronfloor-standing

laboratory microscope
laboratory microscope
laboratory microscope
laboratory microscope
laboratory microscope
laboratory microscope
laboratory microscope
laboratory microscope
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laboratory, for research
transmission electron
Other characteristics


Features JEM-ARM300F GRAND ARM Atomic Resolution Electron Microscope JEM-ARM300F GRAND ARM is an Atomic Resolution Electron Microscope offering a maximum accelerating voltage of 300 kV, and equipped with JEOL’s own Cs Correctors. This instrument guarantees an unprecedented STEM-HAADF image resolution of 58 pm. Realizing an unprecedented STEM-HAADF resolution of 58pm※1 JEOL’s proprietary STEM Cs Correctors delivers a guaranteed resolution of 58 pm for scanning transmission electron microscopy images (STEM images) (accelerating voltage 300 kV) *1 (when the STEM spherical aberration corrector is configured). *1 When equipped with the super high resolution pole piece ETA corrector - JEOL’s own dodeca-pole Aberration corrector ※option The ETA corrector (Expanding Trajectory Aberration corrector) is composed of a dodeca-poles and expanding by JEOL. A STEM spherical aberration corrector and/or a TEM aberration corrector can be configured. A configuration without correctors is also available. HyperCF300 - High performance cold FE gun A newly-designed, high performance, cold field emission gun is equipped in the standard configuration. The high-brightness electron beam with narrow energy spread provides high-resolution observation and analysis. Two types objective lens pole piece Two types objective lens pole piece with unique characteristics was developed to support wide range of user requests. Detecting system  ※option The large solid angle EDS (Energy-dispersive X-ray spectrometer), EELS (Electron energy loss spectrometer), a backscattered electron detector and 4 types of STEM observation detectors are available.


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