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Automatic sample preparation system IB-19510CP
for electron microscopybenchtophigh-speed

automatic sample preparation system
automatic sample preparation system
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Characteristics

Operation
automatic
Applications
for electron microscopy
Configuration
benchtop
Other characteristics
high-speed

Description

New high-speed and fine milling modes achieve even higher throughput of high-quality cross sections. Intermittent milling mode is standard, simplifying the handling of specimens susceptible to heat damage. Improvements to facilitate processing of a wide range of materials include: High-speed processing achieved with a new ion source Reduced specimen damage with fine milling & intermittent mode A Quick Start function reduces total process time A monitor camera is standard, allowing real-time monitoring of the milling process Charge preventive IN-situ coating function (option)

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.