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Laboratory microscope JSM-7610FPlus
SEMultra-high resolution

laboratory microscope
laboratory microscope
laboratory microscope
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Characteristics

Applications
laboratory
Type
SEM
Other characteristics
ultra-high resolution

Description

Features The highly-acclaimed optical system of the JSM-7610F has been updated, achieving even better resolution (15 kV 0.8 nm, 1 kV 1.0nm), and is now available as the JSM-7610FPlus. The Semi-in lens type objective lens and High Power Optics of the irradiation system deliver high-spatial resolution observation and stable analysis capability. In addition, the JSM-7610FPlus can be equipped to satisfy a variety of user needs, including observation at low accelerating voltages with GENTLEBEAM™ mode, and signal selection using r-filter. Semi-in Lens Objective Lens JSM-7610FPlus Semi-in Lens Objective Lens Semi-in lens objective lens design allows ultra-high resolution observation with in-lens detector. High Power Optics High Power Optics A unique electron optical system allows a variety of analyses and observation at high magnification. The in-lens Schottky field emission electron gun, which can deliver a probe current 10 times that of the conventional Schottky field emission electron gun (FEG), along with the aperture-angle control lens (ACL) that can maintain a small probe diameter with the appropriate convergence angle even with the increased probe current, makes it possible to use probe currents of 200 nA or more. The high-power optics provides all the performance you need to conduct everything from high-magnification viewing to EDS and EBSD analyses.

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