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SEM microscope JSM-7900F

SEM microscope
SEM microscope
SEM microscope
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Features JSM-7900F Schottky Field Emission Scanning Electron Microscope JSM-7900F is JEOL’s new flagship FE-SEM which combines extreme high resolution imaging, enhanced stability and exceptional ease of use for any level of operator in multi-purpose environment. Neo Engine(New Electron Optical Engine) Newly developed functionality that integrates lens control system and automatic technology, "Neo Engine" (New Electron Optical Engine) is a standard feature. Even though electron optical condition is changed, there is neglegible change in beam alignment, allowing for fast and easy image acquisition at any accelerating voltage and probe current. The system is the premier example of the advanced JEOL’s electron optics technology. ①Improvement of automation function Specimen: Cross section of mineral (resin-embedded) milled by CP, Acc. Vol.: 5kV, Detector: RBED, Magnification: ×100,000 GBSH-S(GENTLEBEAM™ Super High resolution Stage bias mode) GBSH is a method which improves spatial resolution at any accelerating voltage. Maximum 5kV bias voltage to sample stage is available by newly developed GBSH-S. ※GENTLEBEAM™ is the function which decelerates illuminated electron beam and accelerated electron signal using biased voltage for sample. New Backscattered Electron Detector The newly developed ultra high sensitive backscattered electron detector provides us clear contrast image. Detector sensitivity is highly improved and high compositional contrast image can be observed at low accelerating voltage.


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