XRF spectrometer / for water analysis
2830 ZT



  • Type:


  • Applications:

    for water analysis


2830 ZT
Advanced wavelength dispersive XRF analysis

The 2830 ZT wavelength dispersive X-ray fluorescence (WDXRF) wafer analyzer offers the ultimate capability for measuring film thickness and composition. Designed specifically for the semiconductor and data storage industry, PANalytical’s 2830 ZT Wafer Analyzer enables the determination of layer composition, thickness, dopant levels and surface uniformity for a wide range of wafers up to 300 mm.