XRF spectrometer XRF M4L
for researchbenchtop

XRF spectrometer
XRF spectrometer
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Characteristics

Type
XRF
Applications
for research
Configuration
benchtop

Description

MicrOptik’s XRF M4L is designed for laboratory researches of various types of objects. Analyzer features spacious measurement chamber with actuator operated cover. Free access to all surface of measurement table allows to set samples of any dimensions. Analyzer is equipped with a helium purge channel system and built-in thermal printer. Auto sampler as an option. TECHNICAL CHARACTERISTICS OF ANALYZER EXPERT 4l Continuous operation time Not limited Time on autonomous power supply At least 6 hours Power supply – AC, 50/60 Hz 100-240 V Power consumption measurement unit Less than 30W Dimensions of measuring chamber 397x225x153 mm Maximum weight of the measured sample From 1 mg to 20 kg Dimensions of measurement unit 455x302x301 mm Weight of measurement unit <25 kg Warranty No less than 1 year OPERATING CONDITIONS Operating temperature range -10°C to +45°C Relative humidity within operating temperature range <90%

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