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XRF spectrometer Mini-Z
compactbenchtophigh-resolution

XRF spectrometer
XRF spectrometer
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Characteristics

Type
XRF
Configuration
benchtop, compact
Other characteristics
high-resolution

Description

A series of compact benchtop wavelength dispersive XRF analyzers, the Mini-Z series of analyzers are designed for analyzing specific single elements. Since the optics are optimally configured to a particular element, this series allows for high precision and low detection limits. High precision single element analysis Mini-Z can be configured as a Si analyzer (e.g., for coated Si on paper or plastic), an Al analyzer (e.g., for coated Al on paper or plastic), a Ni analyzer, (e.g., for Ni coating or plating), a Cl analyzer, a P analyzer (e.g., biofuels) or a Zr analyzer (e.g., for Zr coating). Self contained elemental analyzer The Rigaku Mini-Z series benchtop WDXRF spectrometers are completely contained X-ray generating systems. Interlocks and safety "X-RAY ON" indicators are present to protect operators from exposure to X-rays being produced. The spectrometers meet all North American safety codes and are CE marked. Features Excellent LLD Peak and background measurements Easy-to-operate software No cooling water, plug-n-play Light weight and compact body Exceptional repeatability Wide analysis range High-resolution, wavelength dispersive optics No complex sample preparation required (reagent treatment, etc.)
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.