X-ray spectrometer NEX DE VS

EDXRFXRFinspection

high-performance small (variable) spot benchtop EDXRF elemental analyzer, the new Rigaku NEX DE VS delivers wide elemental coverage with a easy-to-learn Windows®-based QuantEZ software. Small spot analysis, from sodium (Na) through uranium (U), of almost any matrix - from solids, thin films and alloys to powders, liquids, slurries and thin films. XRF elemental analysis in the field, plant or lab Especially designed and engineered for heavy industrial use, whether on the plant floor or in remote field environments, the superior analytical power, flexibility and ease-of-use of the NEX DE adds to its broad appeal for an ever expanding range of applications, including exploration, research, bulk RoHS inspection, and education, as well as industrial and production monitoring applications. Whether the need is basic quality control (QC) or its more sophisticated variants — such as analytical quality control (AQC), quality assurance (QA) or statistical process control like Six Sigma — the NEX DE is the reliable high performance choice for routine elemental analysis by XRF. Features Analyze ₁₁Na to ₉₂U non-destructively 1, 3 and 10 mm spot sizes, software selectable High resolution imaging for accurate sample positioning Powerful QuantEZ Windows®-based software Solids, liquids, alloys, powders and thin films 60 kV X-ray tube for wide elemental coverage FAST SDD® detector for superior counting statistics Multiple automated tube filters for enhanced sensitivity Unmatched performance-to-price ratio Optional RPF-SQX fundamental parameters software Optional standardless fundamental parameters software