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XRF spectrometer EDX-7000
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XRF spectrometer
XRF spectrometer
XRF spectrometer
XRF spectrometer
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Characteristics

Type
XRF
Other characteristics
benchtop

Description

The Energy Dispersive X-ray Fluorescence Spectrometer EDX-7000/8000 measures the energy (keV) and intensity of the generated fluorescent X-rays to determine the type and content of the elements comprising a sample. It is applied for non-destructive elemental analysis of solid, powder, and liquid samples. It is widely used by electronics and automobile manufacturers around the world. Principle of Fluorescent X-ray Generation When a sample is irradiated with X-rays from an X-ray tube, the atoms in the sample generate unique X-rays that are emitted from the sample. Such X-rays are known as "fluorescent X-rays" and they have a unique wavelength and energy that is characteristic of each element that generates them. Consequently, qualitative analysis can be performed by investigating the wavelengths of the X-rays. As the fluorescent X-ray intensity is a function of the concentration, quantitative analysis is also possible by measuring the amount of X-rays at the wavelength specific to each element. Functional Design Large Sample Chamber with Small Footprint Installed width is 20% smaller than the previous instrument due to its compact body size. The EDX-7000/8000/8100 can accommodate samples up to a maximum size of W300 x D275 x approx. H100 mm.
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