Revolutionize the Speed of Electron Microscopy
With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution. This unique scanning electron microscope (SEM) is designed for continuous, reliable 24/7 operation. Simply set up your high-throughput data acquisition workflow and your MultiSEM will acquire high contrast images automatically, all by itself.
You control MultiSEM with the proven ZEN imaging software from ZEISS: all options of this powerful SEM are organized in an intuitive yet flexible way.
Microscopy Today Innovation Award for ZEISS MultiSEM 505 scanning electron microscope
Acquire Your Images at Highest Speed and Nanometer Resolution
Profit from up to 91 electron beams working in parallel with unprecedented imaging speed.
Image an area of 1 cm² at 4 nm pixel size in less than 3 hours.
Acquire high contrast images at low noise levels, thanks to optimized SE detection.
Acquire and Image Huge Samples
MultiSEM is equipped with a sample holder covering an area of 10 cm x 10 cm.
Image the entire sample and discover everything you need to answer your scientific questions.
Automated acquisition protocols enable large area imaging - you will get the detailed nanoscale picture‚ without losing the macroscopic context.