The ruggedised SEM with SmartPI User Interface
ParticleSCAN VP: A New Dimension in Process Control
ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been developed for a range of industrial environments either in the field or in a production environment.
The rugged design of ParticleSCAN offers total flexibility and robustness in the automatic analysis of particles. This fully mobile instrument is suitable for rapid re-location and installation to facilitate analyses where and when needed.
Combined with Variable Pressure (VP) technology to simplify sample preparations, ParticleSCAN drives manufacturing capability and yields workflow improvements.
ParticleSCAN features energy dispersive X-ray spectrometry (EDS), SmartSEM interface software and SmartPI particle analysis software. SmartPI software automatically detects, measures, classifies and records the size, shape and chemical composition of particles and provides you with results in easy to understand reports.