X-ray microscope Xradia Versa

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Discover More with Non-destructive 3D X-ray Imaging at Submicron Resolution Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies. ZEISS Xradia 630 Versa 3D expands the horizon of what researchers are able to achieve with their X-ray microscope. The system delivers breakthrough resolution performance, takes accessibility to the next level with an intuitive user experience, and accelerates productivity with faster time-to-results. ■ RaaD 2.0 high resolution across energies ■ Reimagined, redesigned user experience ■ 100X throughput boost with game-changing Al Xradia 620 Versa unlocks new degrees of versatility for your research with non-destructive imaging at maximum flexibility to accelerate your research. Move from exploration to discovery in a seamless workflow. 600-family technical specs with a wider range of imaging options. ■ Automated, programmable filter changer ■ High aspect ratio tomography ■ Dual scan contrast visualization Xradia 610 Versa extends the limits of your exploration with innovative source and optics technology. Higher X-ray flux delivers faster tomography scans with industry-leading resolution and contrast. ■ 500-nanometer spatial resolution