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... system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. Overview The SU5000 FE-SEM has ...
Hitachi High-Technologies
Resolution: 2.1, 1.6 nm
... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...
Hitachi High-Technologies
Resolution: 60, 4, 2.8, 3.5 nm
... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...
Hitachi High-Technologies
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