TESCAN benchtop microscopes

1 company | 8 products
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SEM microscope
SEM microscope
VEGA

Magnification: 1,000,000 unit

... SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes or adapt some features of the Essence software environment to match the GUI of other ...

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TESCAN GmbH
optical microscope
optical microscope
VEGA

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This ...

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TESCAN GmbH
optical microscope
optical microscope
MIRA

TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. ...

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TESCAN GmbH
optical microscope
optical microscope
CLARA

Field-free analytical UHR SEM for materials characterization at the nanoscale Uncompromised characterization of all types of materials at the nanoscale Ideal for characterization of materials at low beam energies for maximum surface ...

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TESCAN GmbH
SEM microscope
SEM microscope
MAGNA

UHR SEM for nanomaterials characterization at sub-nanometer scale High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform ...

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TESCAN GmbH
SEM microscope
SEM microscope

... equipped with a special in-chamber microtome is able to analyze volumes of exceptional dimensions in the field electron microscopy – blocks of almost one cubic millimeter can be examined.This allows us to understand ...

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TESCAN GmbH
FIB-SEM microscope
FIB-SEM microscope
AMBER

All-purpose Ga FIB-SEM for cryo and room temperature structural analysis TESCAN AMBER for Life Sciences represents a cutting-edge Ga FIB-SEM solution that offers multifunctional capabilities for the structural analysis of biological ...

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TESCAN GmbH
FIB microscope
FIB microscope
AMBER X

The TESCAN AMBER X is a high-performance focused plasma ion beam-scanning electron microscope (FIB-SEM) for extra-large volume analysis and high throughput cryo applications. Equipped with the iFIB+ column, TESCAN AMBER ...

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TESCAN GmbH
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