Digital microscope OS-AA
scanning probelaboratorybenchtop

digital microscope
digital microscope
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Characteristics

Type
digital, scanning probe
Applications
laboratory
Configuration
benchtop
Resolution

0.01 nm, 0.13 nm

Description

OS-AA Scanning Probe Microscopy system has multi-functionality and full openness. OS-AA Scanning Probe Microscope is not just a platform for unconventional experiments but also for further developments. Features Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange Input/output signal channel preserved for further system extension Standard external open interface for second developments I-V Curve and Force-Curve Nano-Processing Nano-manipulating with Super-Multimedia technology Designed for Windows Vista/XP/NT/2000/9X Hardcode and Dynamic Code both applied to offline software Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness Specifications Current Sensitivity: ≤10pA Force Sensitivity: ≤ 1nN Positioning Accuracy: ≤ 0.5nm Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC) Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier) DI/DO channels preserved: 8ch DI, 8ch DO

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