Optical spectroscope Anasys nanoIR3-s

infraredAFMfor nanotechnology

Bruker's Anasys nanoIR3-s system combines scattering scanning near-field optical microscopy (s-SNOM) and nanoscale IR spectroscopy (AFM-IR) with an integrated atomic force microscope (AFM), all in a single platform. Building upon the legacy of Anasys technology leadership in AFM-based nano-optical characterization, nanoIR3-s provides nanoscale IR spectroscopy, chemical imaging, and optical property mapping with 10-nanometer spatial resolution demonstrated on 2D material samples. The system also enables AFM topographic imaging and material property mapping with nanometer-scale resolution, making it an ideal instrument for correlative studies across a wide range of material science applications. The nanoIR3-s with broadband option adds the latest OPO/DFG femtosecond laser technology to provide the broadest available spectral range (670 to 4000 cm⁻¹) with high-resolution nanochemical and nano-optical imaging capabilities. Broadband nano-FTIR spectroscopy Delivers previously unobtainable femtosecond nanoscale infrared research. Complementary s-SNOM and AFM-IR techniques Enables nanoscale chemical and optical property mapping on a single platform. Correlative options and accessories Expand nanoscale material property mapping and sample environmental control capabilities. High-Performance Nano FTIR Spectroscopy NanoIR3-s provides: High-performance nano FTIR spectroscopy; High-performance IR SNOM spectroscopy with the most advanced nanoIR laser source available; nano FTIR spectroscopy with integrated DFG, continuum based laser source Broadband synchrotron light source integration; and Multi-chip QCL laser source for spectroscopy and chemical imaging.