- Medical & Pharmaceutical industry
- Medical industry
- Citizen Chiba Precision
Inspection system Wafer
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Description
Wafer Inspection System detects contaminations, or defects and errors, among circuit patterns on a silicon wafer by using SEM System or Dark Field System.
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.