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Wafer Inspection System detects contaminations, or defects and errors, among circuit patterns on a silicon wafer by using SEM System or Dark Field System.
Citizen Chiba Precision
... on the inspection requirements, we can integrate any inspection technology of our Seidenader Solutions as well as add a machine module for leak testing. The machines differ in the dimensions of the footprint ...
Körber Pharma
Extremely easy to use 2D X-ray electronics inspection technology with 3D Computed Tomography (CT) option in one system Ideal entry level non-destructive testing 160 kV X-ray AXI system ...
Waygate Technologies
... single measuring systems with manual assembly all the way through to fully integrated and fully automated testing plants using robots. The sky is the limit when it comes to inspections. Whether optical, ...
... version of the SI3100 for the medical tubing industry. This version includes special lighting and programming to detect gels, voids, bubbles, holes, discolorations and other critical defects. The Surface Inspector ...
Taymer
... , semi-automatic, manual, visual and offline systems Moreover, each inspection system uses the high voltage method Lastly, all of our pharmaceutical Inspection Systems ...
Detectors, weight checkers, and traceability systems are some of Fabrima’s solutions for quality control which may be quickly linked to the other machines. These systems also offer greater safety to the ...
PSS-CT mainly apply to security CT inspection and industry CT inspection system.
Suzhou Powersite Electric
Inspection machines for ampoules, vials and cartridges. In CMP product range SA6, SA12 and SA24 models are the more flexible solution. They were designed in 2010 and continuously updated to meet the requirements ...
Marchesini Group
... improvements, the stage movement speed and detector acquisition speed have also increased, significantly shortening inspection times. The inspection process is now more efficient. The workflow has also ...
... Colored Inspection Throughput - 20 - 200 kg / hour Inspection Objects - Black or Colored Foreign Particle of over φ50μm (diameter), Black or Colored Fiber and Hair of over φ30μm×3mm (diameter). * ...
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