Scanning electron microscope SH-4000M
multipurposedark fieldbenchtop

scanning electron microscope
scanning electron microscope
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Characteristics

Type
scanning electron
Applications
multipurpose
Observation technique
dark field
Configuration
benchtop
Magnification

60,000 unit

Description

High magnification beyond the optical limit SE Detector & BSE Detector – Multi Mode 1kV to 30kV Variable Accelerating Voltage Multi-Vacuum Mode – Standard / Charge Up Reduction Image Observation Ready within 2 min. 3-axis Strokes – X,Y,R Options – EDS System, Cooling Stage Non-conductive samples can be observed without coating, easy to use Auto adjustment functions System can be ready within 2 min after sample exchanged Compact and flexible Friendly GUI High quality images Image resolution up to 5Megapixels Good depth of field Multiple image formats compatible On-screen measurement: Distance, Angle…etc
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.