multipurpose microscope / scanning electron / benchtop / dark field
SH-4000M

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Characteristics

  • Applications:

    multipurpose

  • Type:

    scanning electron

  • Ergonomics:

    benchtop

  • Observation technique:

    dark field

Description

High magnification beyond the optical limit

Max. 60,000x Magnification
SE Detector & BSE Detector - Multi Mode
5kV to 30kV Variable Accelerating Voltage
Multi-Vacuum Mode - Standard / Charge Up Reduction
Image Observation Ready within 2 min.
3-axis Strokes - X,Y,R
Options - EDS System, Cooling Stage

Non-conductive samples can be observed without coating, easy to use

Auto adjustment functions
System can be ready within 2 min after sample exchanged
Compact and flexible
Friendly GUI

High quality images

Image resolution up to 5Megapixels
Good depth of field
Multiple image formats compatible
On-screen measurement: Distance, Angle...etc.