Scanning electron microscope SH-4000Mmultipurposedark fieldbenchtop
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Characteristics
- Type
- scanning electron
- Applications
- multipurpose
- Observation technique
- dark field
- Configuration
- benchtop
- Magnification
60,000 unit
Description
High magnification beyond the optical limit
SE Detector & BSE Detector – Multi Mode
1kV to 30kV Variable Accelerating Voltage
Multi-Vacuum Mode – Standard / Charge Up Reduction
Image Observation Ready within 2 min.
3-axis Strokes – X,Y,R
Options – EDS System, Cooling Stage
Non-conductive samples can be observed without coating, easy to use
Auto adjustment functions
System can be ready within 2 min after sample exchanged
Compact and flexible
Friendly GUI
High quality images
Image resolution up to 5Megapixels
Good depth of field
Multiple image formats compatible
On-screen measurement: Distance, Angle…etc
Catalogs
Scaning Electron Microscope
6 Pages
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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.