Automatic sample preparation system IM4000 II

for SEMcoolingion beam milling

High milling rate: Fast and efficient sample preparation for hard materials Cross-section & flat milling: Flexible options for different applications Cryogenic cooling (optional): Reduces damage to temperature-sensitive samples User-friendly interface: Intuitive touch-screen controls for ease of use Optimized for SEM & AFM: Compatible with Hitachi and third-party microscopes Overview The Hitachi IM4000II and IM5000 ion milling systems provide high-precision sample preparation for scanning electron microscopy. Whether you're analyzing metals, semiconductors, polymers, ceramics or layered materials, these systems ensure high-quality cross-sections and surface polishing with minimal artifacts. Designed for academic research, industrial quality control, and materials science labs, both systems deliver fast, repeatable results, making them essential for advanced electron microscopy applications. The IM4000II is an all-in-one system for both cross-section and/or flat milling, making it a flexible option for labs needing a basic sample prep tool. The more advanced IM5000 features a higher milling rate and wide-area cross-section milling, making it perfect for demanding applications and labs that need high throughput Features and benefits Reduce turnaround times without compromising sample integrity. The IM4000II achieves a 500 μm/h milling rate, while the IM5000 offers an impressive 1 mm/h or more (for Si sample with protrusion of 100 μm). Perfect for hard materials like metals and semiconductors that need extended milling. Get the flexibility to prepare samples exactly how you need them.