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Electron microscopy sample preparation systems
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... store samples in one device Vacuum-controlled cleaning to suit a range of sample types Overview Hydrocarbon contamination is one of the most common barriers to high-quality SEM and TEM ...
Hitachi High-Tech Europe GmbH
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
Hitachi High-Tech Europe GmbH
... of use Optimized for SEM & AFM: Compatible with Hitachi and third-party microscopes Overview The Hitachi IM4000II and IM5000 ion milling systems provide high-precision sample ...
Hitachi High-Tech Europe GmbH
... The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Features Cross-section milling rate: ...
Hitachi High-Tech Europe GmbH
automated sample preparation systemQG-3100
... Automated EM Stainer After ultramicrotomy, most sections require contrasting with lead and uranyl salts. As well as being hazardous if not handled correctly, both can cause precipitates during the contrasting process. To provide a safe and healthy ...
Boeckeler Instruments, Inc.
... of a protocol. Frugal! Can use just a couple of milliliters of fluid for one sample up to 18ml for a full load (up to 48 sample compartments). Two proven sample handling systems, either ...
Boeckeler Instruments, Inc.
automatic sample preparation systemEM GP2
... updated EM GP2 automatic plunge freezer is designed for reproducible vitrification of fluid and ultra‑thin samples on electron microscopy grids. Samples are blotted automatically to remove ...
Leica Microsystems
... specimens for electron microscopy with consistent, automated workflows using the EM TP automated tissue processor. The system reduces manual handling by at least 75% through programmable, automatic steps ...
Leica Microsystems
... low-temperature embedding and resin polymerization for correlated light and electron microscopy workflows. When paired with the optional Leica EM FSP automated reagent handling system, the AFS2 automates ...
Leica Microsystems
... cycles for reproducible results
Leica Microsystems
... revealing true sample structures for downstream Electron Microscopy analysis. Adaptable and flexible, the EM TIC 3X supports a broad range of experiments with easily exchangeable stages and sample ...
Leica Microsystems
... The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6.4 mm, 8 mm and 10 mm. Since the introduction of the world’s first glass knife maker in 1962, Leica Microsystems has continuously refined the technique ...
Leica Microsystems
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
... CROSS SECTION POLISHER™ (CP) is a device to prepare a cross section of a specimen for electron microscopy. Since a cross section is prepared with an ion beam, it is possible to obtain a good quality cross section in ...
Jeol
... multi-purpose stage combined with specialized functional holders allows the user to perform various functions such as planar surface milling and polishing, sputter coating as well as more traditional cross-section ion milling. Features High ...
Jeol
... irradiated at a low angle relative to the sample, allowing contamination on the surface layer to be removed, as well as smoothing of the surface. It is also ideal for selective etching. Cross Section Preparation ...
Jeol
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