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... observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. ...
Hitachi High-Tech Europe GmbH
... observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. ...
Hitachi High-Tech Europe GmbH
IM4000 II is a modular computer-controlled argon ion polishing system that can be equipped as a pure surface polisher, as a cross-section polisher or as a hybrid system, depending on ...
Hitachi High-Tech Europe GmbH
... processing of several individual positions is also possible as an option; the optional multiple sample holder allows automatic processing of up to 3 samples. The ArBlade 5000 / IM5000 is equipped ...
Hitachi High-Tech Europe GmbH
Automated EM Stainer After ultramicrotomy, most sections require contrasting with lead and uranyl salts. As well as being hazardous if not handled correctly, both can cause precipitates during the contrasting process. To provide ...
Boeckeler Instruments, Inc.
... of a protocol. Frugal! Can use just a couple of milliliters of fluid for one sample up to 18ml for a full load (up to 48 sample compartments). Two proven sample handling systems, ...
Boeckeler Instruments, Inc.
The balanced break method of the Leica EM KMR3 ensures perfect glass knives in three thicknesses 6.4 mm, 8 mm and 10 mm. Since the introduction of the world’s first glass knife maker in 1962, Leica Microsystems has continuously refined ...
... performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems. Flexible system ...
CROSS SECTION POLISHER™ (CP) is a device to prepare a cross section of a specimen for electron microscopy. Since a cross section is prepared with an ion beam, it is possible to obtain a good quality ...
Jeol
... multi-purpose stage combined with specialized functional holders allows the user to perform various functions such as planar surface milling and polishing, sputter coating as well as more traditional cross-section ion ...
Jeol
... irradiated at a low angle relative to the sample, allowing contamination on the surface layer to be removed, as well as smoothing of the surface. It is also ideal for selective etching. Cross Section ...
Jeol
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
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