AFM microscope SignatureSPM

opticalRamanlaboratory

SignatureSPM is the first microscope built on a multimodal characterization platform, integrating an automated Atomic Force Microscope (AFM) with a Raman/Photoluminescence spectrometer, enabling true colocalized measurements of physical and chemical properties. Through the combined physical and chemical knowledge obtained in a single, and real-time measurement, the researcher can obtain a reliable and comprehensive analysis of the sample, with a shortened time to knowledge as a result of lesser sample handling and a data acquisition of with a high confidence level, thanks to the correlation of difference measurements. All AFM modes included as standard All AFM modes are included in the basic package of SignatureSPM: Kelvin Probe Microscopy, Piezo Response Force Microscopy, Magnetic Force Microscopy, Nanolithography, Force-curve Measurements. Wide range spectrometer optimized for Raman and photoluminescence Designed for spectroscopy imaging, the spectrometer of the SignatureSPM ensures minimal light loss with its achromatic design and impressive 95% light reflectivity. It provides a unique capability to perform accurate and efficient Raman and PL measurements thanks to its versatile design that can accommodate up to 3 gratings for a wide spectral range covering. True co-localized measurements with "Probe away" The software command "Probe away" moves the cantilever away from the sample's surface so that fully unobstructed confocal Raman maps can be obtained. With the "Probe back" command, the AFM tip will automatically return to its previous analysis point on the sample's surface.