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Automatic sample preparation system IB-10500HMS
laboratorycoolingbenchtop

automatic sample preparation system
automatic sample preparation system
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Characteristics

Operation
automatic
Applications
laboratory
Preparation type
cooling
Configuration
benchtop

Description

The high throughput milling system optimizes the ion source electrodes and enables higher accelerating voltages, thus improving the ion-beam current density. Our newly developed ion source achieves a high milling rate of cross-section of 1.2 mm/h or more (2.4 times than the previous milling rate.) The right SEM image shows an Sn-Bi alloy with a melting point of 150°C. A low melting-point metal can be melted due to the processing heat; therefore, cooling of the metal is required before milling. High throughput milling is applied to the heat-sensitive specimen while the specimen is kept cooled *3. Then, a cross-section specimen with a reduced heat damage is obtained in a short time. The new high throughput milling system has enabled the irradiation of an ion beam onto a larger area of the specimen. Planar surface milling is effective to remove scratches generated on the specimen surface or crystalline strains, which are caused by mechanical polishing. Planar surface milling of a concrete Accelerating voltage: 10 kV Milling time: 20 min Large-area planar surface milling was applied to a concrete with a width of 20mm. After milling, polish scratches and contamination were removed, allowing for clear observation of particles of stone and cement contained in a concrete.

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Exhibitions

Meet this supplier at the following exhibition(s):

Analytica China 2024
Analytica China 2024

18-20 Nov 2024 Shanghai (China)

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    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.