video corpo

Mass spectrometer JMS-S3000 SpiralTOF™-plus 2.0
time-of-flightfor life sciences applicationsbenchtop

mass spectrometer
mass spectrometer
mass spectrometer
mass spectrometer
Add to favorites
Compare this product
 

Characteristics

Type
mass, time-of-flight
Applications
for life sciences applications
Configuration
benchtop

Description

Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer Clicking the Play button starts the video (approx. 4 minutes). The JMS-S3000 is a MALDI-TOFMS* that incorporates the innovative SpiralTOF ion optics. The JMS-S3000 has evolved into SpiralTOF™-plus 2.0 with much wider dynamic range. The JMS-S3000 defines a new standard in MALDI-TOFMS performance and provides state-of-the-art analytical solutions for a wide range of research areas such as functional synthetic polymers, materials science, and biomolecules. Matrix-Assisted Laser Desorption/Ionization Time-of-Flight Mass Spectrometer Reduced topographic effect of matrix crystal The topographic effect of the matrix crystal leads to a difference in flight start position for the ions, resulting in a difference in flight time. In the conventional ion optical system, this time difference degrades the mass resolving power and also the mass accuracy obtained with external mass calibration. With its extended flight distance, the JMS-S3000 reduces this effect to the minimum and achieves highly reproducible mass resolving power and high mass accuracy with an external mass calibration. High mass-resolution and mass accuracy can be maintained for imaging analysis of a biological specimen in which a large number of mass spectra are acquired across a large area and the specimen surface is likely to be uneven. Achieving a wide dynamic range The SpiralTOF™-plus 2.0 has realized a wide dynamic range by greatly improving the detection system. This makes it possible to simultaneously detect peaks with ion intensity differences of about 4 orders of magnitude.

VIDEO

Catalogs

No catalogs are available for this product.

See all of Jeol‘s catalogs

Exhibitions

Meet this supplier at the following exhibition(s):

Analytica China 2024
Analytica China 2024

18-20 Nov 2024 Shanghai (China)

  • More information
    *Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.