Automatic sample preparation system EM TIC 3X
laboratoryfor electron microscopybenchtop

automatic sample preparation system
automatic sample preparation system
automatic sample preparation system
automatic sample preparation system
automatic sample preparation system
automatic sample preparation system
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Characteristics

Operation
automatic
Applications
laboratory, for electron microscopy
Configuration
benchtop

Description

The Triple Ion Beam Milling System, EM TIC 3X allows production of cross sections and planar surfaces for Scanning Electron Microscopy (SEM), Microstructure Analysis (EDS, WDS, Auger, EBSD) and, AFM investigations. With the EM TIC 3X you achieve high quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near native state as possible. What really counts regarding the efficiency of an ion beam miller is excellent quality results with high throughput. It’s not enough that we could increase the milling rate by a factor of 2 compared to the previous version but the unique triple ion beam system optimizes the preparation quality and reduces working time. Up to three samples can be processed in one session. Cross sectioning and polishing can be performed by one stage. Workflow solutions provide safe and efficient transfer of samples to subsequent preparation instruments or analysis systems.

Catalogs

EM TIC 3X
EM TIC 3X
16 Pages
EM TXP
EM TXP
10 Pages
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.