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Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid angle EDX detector(s), all in a single objective lens configuration. The HF5000 builds on features from Hitachi HD-2700 dedicated STEM ...
Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm
... The HT7800 series is a 120 kV transmission electron microscope (TEM) that combines high-quality and reproducible data acquisition with improved efficiency for observation work. By automating routine alignments and settings, and featuring ...
Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
... The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope ( STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...
Resolution: 0.05 nm - 0.17 nm
... elemental maps. The TEM column is covered by a box-type enclosure, which can reduce the effect of environmental changes such as temperature, air flow, acoustic noise and so on, and then it improves the stability of microscope. ETA ...
Jeol
Resolution: 0.1, 0.11, 0.25, 0.07, 0.16 nm
... atomic-resolution imaging. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM imaging ...
Jeol
Resolution: 0.14, 0.19, 0.16, 0.23 nm
... field emission transmission electron microscope, which features higher spatial resolution and analytical performance coupled with intuitive user interface for multi-purpose operation. Features High-resolution TEM/ STEM ...
Jeol
... Selected Area Electron Diffraction) modes as well as in scanning modes ( STEM– Scanning Transmission Electron Microscope and SEM – Scanning Electron Microscope avec BSE – Backscattered ...
... (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform suitable for SEM/ STEM metrology at sub-nanometer scale Fast setup of the electron beam – optimal imaging conditions are guaranteed ...
TESCAN GmbH
... Electron Beam Precession and near-UHV A novel approach to STEM User Experience Analytical 4D- STEM The full picture of electron beam - specimen interaction 4D- STEM is the microscopy ...
TESCAN GmbH
... Robust design with all metal frames for the college and STEM marketplace; Featuring dual carrying handles available in 8 different colors for Laboratory Identification, LED illumination is standard across all models ...
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