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Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron ...
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for ...
Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm
The HT7800 family supports a wide range of applications, from life sciences to materials science. It’s available in three different pole piece variants, always based on our patented objective lens for fast switching between high contrast ...
... Selected Area Electron Diffraction) modes as well as in scanning modes (STEM– Scanning Transmission Electron Microscope and SEM – Scanning Electron Microscope avec BSE ...
Resolution: 0.05 nm - 0.17 nm
... elemental maps. The TEM column is covered by a box-type enclosure, which can reduce the effect of environmental changes such as temperature, air flow, acoustic noise and so on, and then it improves the stability of ...
Jeol
Resolution: 0.1, 0.07, 0.16, 0.11, 0.25 nm
... atomic-resolution imaging. Furthermore, a new STEM detector that provides enhanced contrast of light elements is incorporated as a standard unit. Contrast enhancement of light elements is achieved by a new STEM ...
Jeol
Resolution: 0.23, 0.19, 0.16, 0.14 nm
... field emission transmission electron microscope, which features higher spatial resolution and analytical performance coupled with intuitive user interface for multi-purpose operation. Features High-resolution TEM/STEM ...
Jeol
... (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale Fast setup of the electron beam – optimal imaging conditions ...
TESCAN GmbH
... Electron Beam Precession and near-UHV A novel approach to STEM User Experience Analytical 4D-STEM The full picture of electron beam - specimen interaction 4D-STEM is the microscopy ...
TESCAN GmbH
Robust design with all metal frames for the college and STEM marketplace; Featuring dual carrying handles available in 8 different colors for Laboratory Identification, LED illumination is standard across all models
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