SEM microscope MAGNA
STEMfor materials researchtabletop

SEM microscope
SEM microscope
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Characteristics

Type
SEM, STEM
Applications
for materials research
Configuration
tabletop
Other characteristics
high-resolution

Description

UHR SEM for nanomaterials characterization at sub-nanometer scale High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform suitable for SEM/STEM metrology at sub-nanometer scale Fast setup of the electron beam – optimal imaging conditions are guaranteed by the In-Flight Beam Tracing™ Multi-detector system TriBE™ and TriSE™ for sample nanocharacterization Intuitive software modular platform designed for effortless operation regardless users’ skill level
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.