JEM-F200 is a new field emission transmission electron microscope, which features higher spatial resolution and analytical performance, an easy to use new operation system for multi-purpose operation, a smart appearance, and various environmentally friendly, energy saving system.
The JEM-F200 has a new, and fine appearance.
It incorporates a new, intuitive user interface specifically designed for analytical electron microscopy.
It also features outstanding mechanical and electrical stability, which reflects JEOL's engineering expertise accumulated over the years.
Quad-Lens condenser system
Today's electron microscopy requires to support a wide range of imaging techniques from bright field/dark field TEM to STEM that uses a variety of detectors.
The JEM-F200, with its new 4-stage probe-forming optical system, that is, Quad-Lens Condenser System, controls intensity and the convergence angle of electron beam independently, to respond to the different research requirements.
Advanced Scan system
The JEM-F200 incorporates a new scanning system, Advanced Scan System, which is capable of scanning the electron beam in the image probe forming systems. This accomplishes wide field STEM-EELS.
Pico Stage Drive
The JEM-F200 uses a pico stage drive, which is capable of driving the stage in 200 pico meter step without a piezo drive, and moving the view area with a wide dynamic range from an entire sample grid to atomic order images.
SPECPORTER (auto holder loading/unloading device)
Loading/unloading of a specimen holder has been considered to bring a human error of operation, especially for the beginners.