Microscope camera iKon-M SY

digitalUSB

Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from 20keV. 5 Year Vacuum Warranty Standalone’ Be Window Multi-Megahertz readout Crop mode operation USB 2.0 connection Overview Andor’s standalone USB 2.0 iKon-M SY 934 series features a high-QE, back-illuminated sensor for direct X-ray detection. A convenient Berylium foil window blocks visible wavelengths with minimal ‘Beam Hardening’ of X-ray energies giving a direct detection energy range from 20keV. This 1024 x 1024 sensor array with 13 x 13 μm pixels offers high dynamic range and high spatial resolution. Seamless software selection of a range of kHz and Multi-MHz readout speeds provide exceptionally low readout noise and faster frame rates respectively. Features UltraVac™ - 5 Year Warranty. Proprietary and proven vacuum process, critical for sustained vacuum integrity, sensor protection and unequalled cooling, year after year. 'Standalone’ Be Window - 200 µm Berylium window as standard 13 x 13 µm pixel size - Optimal balance of dynamic range and resolution Ultra-low noise readout - Intelligent low-noise electronics offer the most ‘silent’ system noise available Multi-Megahertz pixel readout - High frame rates achievable (5 MHz in visualization mode, 50 kHz for the highest sensitivity and signal-to-noise ratio) USB 2.0 connection - USB plug and play – no controller box Enhanced baseline clamp - Quantitative accuracy of dynamic measurements.