Andor’s USB 2.0 ikon-M SO series features high-QE, sensors for direct detection of soft X-Ray EUV or VUV photons. A convenient 16-point, knife-edge sealed 6” rotatable CF152 flange provides a robust and highly-effective seal to any compatible vacuum chamber interface.
Open front end
Peak QE of 95%
13 x 13 μm pixel size
TE cooling to -100°C
Ultra-low noise readout
Andor’s iKon series offers outstanding sensitivity performance through a combination of > 95% QE back-illuminated sensors, low noise readout electronics and industry-leading, maintenance-free deep TE-cooling down to -100°C. It features high resolution 1 and 4.2 Megapixel large area sensor options (with 13 and 13.5 μm pixels respectively) for simultaneous high dynamic range and high spatial resolution imaging in the VUV and soft x-ray range.
A convenient 16-point, knife-edge sealed 6” rotatable CF-152 flange provides a robust and highlyeffective seal to any compatible vacuum chamber interface. The iKon-M and -L also offer a USB2 interface and Labview or EPICS compatibility for seamless integration into complex setups.
Open front end - DN100CF / 6” CF / CF-152 flange and knife-edge sealing provided as standard for direct interfacing to vacuum chambers (rotatable design for iKon-M models).
1 MP and 4.2 MP sensor options - Choice of acquisition speed or large field-of-view to best match experimental needs.
13 x 13 µm pixel size - Ideal balance of dynamic range and resolution, on-head binning to extend dynamic range.