Scanning electron microscope SU3800

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Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples. 1.Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples ■Robust Stage for Flexibility in Sample Size, Shape, and Weight The specimen exchange sequence prevents potential damage to the system or the sample. Exchange the specimens without venting the specimen chamber, improving throughput. Increase sample manipulation with Stage Free Mode*. The Chamber Scope enhances the safety of stage movements*. ■Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation Integrated in-chamber camera display Easily navigate the entire observable area Detector-oriented rotation 2.Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level ■Multiple Modes of Operation ■ Automatic Functions for Operators of Any Skill Level Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N) Improved auto focus function Features of our proprietary Intelligent Filament Technology (IFT): ■Multi Zigzag enables wide-area observation across multiple areas. ■Report Creator generates reports of acquired data. 3.Integrated Solutions for Various Applications ■A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber. ■SEM/EDS Integration System* ■High Sensitivity Detectors Supporting All Observation Requirements CL observation Using UVD*