Digital microscope SU8700
SEMfield emission scanninglaboratory

digital microscope
digital microscope
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Characteristics

Type
digital, SEM, field emission scanning
Applications
laboratory
Configuration
benchtop
Other characteristics
high-resolution
Magnification

Max.: 2,000,000 unit

Min.: 20 unit

Description

The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, high probe current, automation, efficient workflows for users of all experience levels, and more. Features Ultrahigh-Resolution and Analytical Capability Hitachi’s Schottky emitter provides ultrahigh-resolution images and ultrafast microanalysis with high probe current. Its 0.1kV imaging capability without stage bias expands the application range for beam-sensitive specimens.A multitude of detectors and options are available to best suit the needs of any user. Enhanced User Experience with Advanced Automation The “EM Flow Creator“ software option allows users to configure repeatable SEM operation sequences. Various SEM functions can be assembled in the EM Flow Creator’s window by a drag-and-drop method and then saved as a recipe for later use. Once a recipe is configured, automated data collection under the set conditions can be performed with high accuracy and repeatability. New Display and Interface Features Dual monitor configuration supports a flexible and highly efficient workspace. Display and save 6 signals simultaneously in order to acquire more information in less time. Acquire up to 40,960 x 30,720 pixels of high-resolution information. Top-left image was acquired with >120 μm of FOV. The yellow rectangle field in the image is also shown in right image with an increase of digital magnification. Even after digitally enhancing the original image more than 20 times,

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