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Laboratory software EM-05500TGP
for transmission electron microscopesvisualizationacquisition

laboratory software
laboratory software
laboratory software
laboratory software
laboratory software
laboratory software
laboratory software
laboratory software
laboratory software
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Characteristics

Applications
laboratory, for transmission electron microscopes
Function
visualization, acquisition, measurement

Description

3-dimensional Structure with high precision TEM Tomograph System is an automation system handling an entire process from an acquisition of sequential tilt images through to their 3-dimensional reconstruction. Its software (Recorder, Composer, Visualizer-Kai) employ unique algorithms for enabling the automation of various adjustments particularly required to Tomography. Features Recorder This software acquires sequential tilt images in a short time for Tomography. Many images of samples, taken in the course of continuous tilting with certain angle step, are necessary for accurate reconstruction. Operations such as sample tilting at a pre-set angle step, correction of view shift stemming from the tilt, adjustment of focusing and the acquisition of images are automatically carried out. Composer This software performs a 3-dimensional reconstruction from sequentially acquired tilt images. Crucial element required to the electron beam tomography is how to make an accurate alignment of the image data. This is resolved by calculation of 3-dimensional position on the tilt axis and analyzing the precise angle information, and as a result, a precise reconstruction in a short time with easy operation has been realized. Visualizer-Kai This software displays 3-dimensionally-reconstructed data by various methods such as volume rendering and surface rendering and also enables the intuitive observation on the screen as if handling by hands. By using a mouse, the images can be freely moved and displayed. The function of length measurement is also included. Application Example of 3-dimensional Reconstruction: 3-dimensional structure analysis of a Tight junction

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Analytica China 2024
Analytica China 2024

18-20 Nov 2024 Shanghai (China)

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