Cryoelectronic microscope CRYO ARM™ 300 II

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CRYO ARM™ 300 II is a cryo-electron microscope that specializes in the observation of electron beam-sensitive specimens, such as protein, for single particle analysis, tomography and MicroED. This system offers improved stability, throughput and ease of use compared to the previous generation of cryo-EMs. Moreover, this is an all-in-one system that can handle everything from screening to data acquisition, allowing for more flexibility in operation at the customer sites to meet the needs of the facility. These improvements allow users to obtain high quality images by simple operations even for those who have never used an electron microscope before. Features High Throughput －Increased productivity for cost effectiveness－ Quick Collection The JEM-3300 CRYO ARM™ 300 II achieves high speed data acquisition by combining beam shift with precise specimen stage movement. The excellent beam control of this system minimizes the beam tilt that causes coma aberration, even with beam shift. Hence, the throughput can be increased without degrading image quality. Zero Fringe System In addition to the ordinary beam illumination, the CRYO ARM™ 300 II has a unique "Koehler mode" illumination. This mode has no interference fringes and eliminates electron-beam damage to areas not used for imaging and allows you to get more images from a smaller area. Highly Flexible Operation －As you would like－ High precision stage drive The CRYO ARM™ 300 II has a rotation free stage. The advantage of this stage is excellent positional reproducibility. Even if you move samples back and forth between the microscope column and sample storage,you can reuse low magnification images,